HP compaq nx9020 - Nie widzi dysku twardego po dłuższej przerwie w pracy

processor : 0
vendor_id : GenuineIntel
cpu family : 6
model : 9
model name : Intel(R) Celeron(R) M processor 1400MHz
stepping : 5
microcode : 0x45
cpu MHz : 1396.440
cache size : 512 KB
physical id : 0
siblings : 1
core id : 0
cpu cores : 1
apicid : 0
initial apicid : 0
fdiv_bug : no
f00f_bug : no
coma_bug : no
fpu : yes
fpu_exception : yes
cpuid level : 2
wp : yes
flags : fpu vme de pse tsc msr pae mce cx8 sep mtrr pge mca cmov clflush dts acpi mmx fxsr sse sse2 tm pbe bts
bogomips : 2792.88
clflush size : 64
cache_alignment : 64
address sizes : 36 bits physical, 32 bits virtual
power management:

total used free shared buffers cached
Mem: 732844 650420 82424 69592 24948 300844
-/+ buffers/cache: 324628 408216
Swap: 751612 108 751504

=== START OF INFORMATION SECTION ===
Model Family: SAMSUNG SpinPoint M40/60/80
Device Model: SAMSUNG HM100JC
Serial Number: S0CFJ10L233386
Firmware Version: YN100-12
User Capacity: 100,030,242,816 bytes [100 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-7 T13/1532D revision 0
Local Time is: Wed Feb 11 17:28:31 2015 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 57) A fatal error or unknown test error
occurred while the device was executing
its self-test routine and the device
was unable to complete the self-test
routine.
Total time to complete Offline
data collection: ( 4416) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 73) minutes.
SCT capabilities: (0x003f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 093 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 3008
4 Start_Stop_Count 0x0032 081 081 000 Old_age Always - 19815
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 4
7 Seek_Error_Rate 0x000e 253 253 000 Old_age Always - 0
8 Seek_Time_Performance 0x0024 253 253 000 Old_age Offline - 0
9 Power_On_Half_Minutes 0x0032 099 099 000 Old_age Always - 5796h+41m
10 Spin_Retry_Count 0x0032 253 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 087 087 000 Old_age Always - 13722
191 G-Sense_Error_Rate 0x0012 093 093 000 Old_age Always - 77678
192 Power-Off_Retract_Count 0x0012 253 253 000 Old_age Always - 0
194 Temperature_Celsius 0x0022 124 067 000 Old_age Always - 38
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 221666
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 4
197 Current_Pending_Sector 0x0012 253 253 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 199 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0
201 Soft_Read_Error_Rate 0x0012 253 253 000 Old_age Always - 0
223 Load_Retry_Count 0x0012 100 100 000 Old_age Always - 10
225 Load_Cycle_Count 0x0012 048 048 000 Old_age Always - 529354
255 Unknown_Attribute 0x000a 253 100 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 171 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 171 occurred at disk power-on lifetime: 5719 hours (238 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 00 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000000 = 0

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 ff 01 00 00 00 e0 00 00:00:05.500 READ DMA
c8 ff 01 00 00 00 e0 00 00:00:05.375 READ DMA
c8 ff 01 3f 00 00 e0 00 00:00:05.375 READ DMA
c8 ff 01 00 00 00 e0 00 00:00:05.375 READ DMA
c8 ff 01 ee 55 12 e0 00 00:00:05.375 READ DMA

Error 170 occurred at disk power-on lifetime: 5703 hours (237 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 00 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000000 = 0

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 ff 01 00 00 00 e0 00 00:00:05.000 READ DMA
f5 ff 70 03 00 00 e0 00 00:00:04.188 SECURITY FREEZE LOCK
b0 da 00 ff 4f c2 e0 00 00:00:04.125 SMART RETURN STATUS
ec 03 00 ff 4f c2 a0 00 00:00:03.938 IDENTIFY DEVICE
e3 03 f2 ff 4f c2 e0 00 00:00:03.875 IDLE

Error 169 occurred at disk power-on lifetime: 5700 hours (237 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 08 68 95 09 e0 Error: ICRC, ABRT 8 sectors at LBA = 0x00099568 = 628072

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 68 95 09 e0 00 00:01:24.875 READ DMA
c8 00 08 38 1a 07 e0 00 00:01:24.813 READ DMA
c8 00 40 4a ea b8 e6 00 00:01:24.813 READ DMA
c8 00 30 18 2a 8d e6 00 00:01:24.813 READ DMA
c8 00 00 e0 91 eb e5 00 00:01:24.813 READ DMA

Error 168 occurred at disk power-on lifetime: 5700 hours (237 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 b0 ca 78 e6 Error: ICRC, ABRT at LBA = 0x0678cab0 = 108579504

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ca 00 00 b0 ca 78 e6 00 00:01:05.313 WRITE DMA
ca 00 00 18 2c d1 e0 00 00:01:04.688 WRITE DMA
ca 00 00 18 2b d1 e0 00 00:01:04.688 WRITE DMA
ca 00 43 10 90 7e e1 00 00:01:04.563 WRITE DMA
ca 00 00 10 8f 7e e1 00 00:01:04.563 WRITE DMA

Error 167 occurred at disk power-on lifetime: 5700 hours (237 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 80 50 a5 28 e0 Error: ICRC, ABRT 128 sectors at LBA = 0x0028a550 = 2663760

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 80 50 a5 28 e0 00 00:00:47.063 READ DMA
ca 00 08 b8 10 5f e0 00 00:00:47.063 WRITE DMA
c8 00 38 70 29 28 e0 00 00:00:47.063 READ DMA
c8 00 80 f0 28 28 e0 00 00:00:47.063 READ DMA
c8 00 80 70 28 28 e0 00 00:00:47.063 READ DMA

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Fatal or unknown error 90% 5795 0
# 2 Short offline Fatal or unknown error 90% 5791 0
# 3 Short offline Fatal or unknown error 90% 5791 0
# 4 Short offline Fatal or unknown error 90% 5791 0
# 5 Short offline Fatal or unknown error 90% 5786 0

SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.