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SAMSUNG HN-M750MBB - sprawdzenie SMART logu, dysk świeżo po zerowaniu/remapingu

Koms77 06 Gru 2016 19:13 387 4
  • #1 06 Gru 2016 19:13
    Koms77
    Poziom 9  

    Witam

    prosiłbym o sprawdzenie poniższego logu SMART oraz wydanie osądy czy z tego dysku coś jeszcze będzie. Dysk świeżo po zerowaniu programem DD oraz remapingu MHDD (według instrukcji znalezionej na forum). Dysk nie został mechanicznie uszkodzony (nie upadł).

    Code:


    smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-53-generic] (local build)
    Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org

    === START OF INFORMATION SECTION ===
    Model Family: SAMSUNG SpinPoint M8 (AF)
    Device Model: SAMSUNG HN-M750MBB
    Serial Number: S2R9J1KBB01338
    LU WWN Device Id: 5 0024e9 0051bdd3e
    Firmware Version: 2AR10001
    User Capacity: 750,156,374,016 bytes [750 GB]
    Sector Size: 512 bytes logical/physical
    Rotation Rate: 5400 rpm
    Form Factor: 2.5 inches
    Device is: In smartctl database [for details use: -P show]
    ATA Version is: ATA8-ACS T13/1699-D revision 6
    SATA Version is: SATA 3.0, 3.0 Gb/s (current: 3.0 Gb/s)
    Local Time is: Tue Dec 6 19:00:45 2016 CET
    SMART support is: Available - device has SMART capability.
    SMART support is: Enabled

    === START OF READ SMART DATA SECTION ===
    SMART overall-health self-assessment test result: PASSED

    General SMART Values:
    Offline data collection status: (0x00)   Offline data collection activity
                   was never started.
                   Auto Offline Data Collection: Disabled.
    Self-test execution status: ( 0)   The previous self-test routine completed
                   without error or no self-test has ever
                   been run.
    Total time to complete Offline
    data collection:       ( 9540) seconds.
    Offline data collection
    capabilities:           (0x5b) SMART execute Offline immediate.
                   Auto Offline data collection on/off support.
                   Suspend Offline collection upon new
                   command.
                   Offline surface scan supported.
                   Self-test supported.
                   No Conveyance Self-test supported.




                   Selective Self-test supported.
    SMART capabilities: (0x0003)   Saves SMART data before entering
                   power-saving mode.
                   Supports SMART auto save timer.
    Error logging capability: (0x01)   Error logging supported.
                   General Purpose Logging supported.
    Short self-test routine
    recommended polling time:     ( 2) minutes.
    Extended self-test routine
    recommended polling time:     ( 159) minutes.
    SCT capabilities:     (0x003f)   SCT Status supported.
                   SCT Error Recovery Control supported.
                   SCT Feature Control supported.
                   SCT Data Table supported.

    SMART Attributes Data Structure revision number: 16
    Vendor Specific SMART Attributes with Thresholds:
    ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
    1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 5812
    2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0
    3 Spin_Up_Time 0x0023 089 084 025 Pre-fail Always - 3466
    4 Start_Stop_Count 0x0032 093 093 000 Old_age Always - 7984
    5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0
    7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0
    8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0
    9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 18752
    10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0
    11 Calibration_Retry_Count 0x0032 091 091 000 Old_age Always - 9844
    12 Power_Cycle_Count 0x0032 096 096 000 Old_age Always - 4571
    181 Program_Fail_Cnt_Total 0x0022 097 097 000 Old_age Always - 76734344
    191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 865
    192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0
    194 Temperature_Celsius 0x0002 064 047 000 Old_age Always - 36 (Min/Max 9/53)
    195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0
    196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0
    197 Current_Pending_Sector 0x0032 252 100 000 Old_age Always - 0
    198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0
    199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0
    200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 5992
    223 Load_Retry_Count 0x0032 091 091 000 Old_age Always - 9844
    225 Load_Cycle_Count 0x0032 088 088 000 Old_age Always - 125348

    SMART Error Log Version: 1
    ATA Error Count: 123 (device log contains only the most recent five errors)
       CR = Command Register [HEX]
       FR = Features Register [HEX]
       SC = Sector Count Register [HEX]
       SN = Sector Number Register [HEX]
       CL = Cylinder Low Register [HEX]
       CH = Cylinder High Register [HEX]
       DH = Device/Head Register [HEX]
       DC = Device Command Register [HEX]
       ER = Error register [HEX]
       ST = Status register [HEX]
    Powered_Up_Time is measured from power on, and printed as
    DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
    SS=sec, and sss=millisec. It "wraps" after 49.710 days.

    Error 123 occurred at disk power-on lifetime: 18740 hours (780 days + 20 hours)
    When the command that caused the error occurred, the device was active or idle.

    After command completion occurred, registers were:
    ER ST SC SN CL CH DH
    -- -- -- -- -- -- --
    40 51 08 58 7e 5e e7 Error: UNC 8 sectors at LBA = 0x075e7e58 = 123633240

    Commands leading to the command that caused the error were:
    CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
    -- -- -- -- -- -- -- -- ---------------- --------------------
    c8 00 08 58 7e 5e e7 00 00:00:00.923 READ DMA
    c8 00 08 e8 b9 50 e6 00 00:00:00.923 READ DMA
    ca 00 38 28 f4 10 e0 00 00:00:00.923 WRITE DMA
    ca 00 38 90 e0 ef e0 00 00:00:00.923 WRITE DMA
    ca 00 80 e8 d7 d3 e5 00 00:00:00.923 WRITE DMA

    Error 122 occurred at disk power-on lifetime: 18740 hours (780 days + 20 hours)
    When the command that caused the error occurred, the device was active or idle.

    After command completion occurred, registers were:
    ER ST SC SN CL CH DH
    -- -- -- -- -- -- --
    40 51 08 58 7e 5e e7 Error: UNC 8 sectors at LBA = 0x075e7e58 = 123633240

    Commands leading to the command that caused the error were:
    CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
    -- -- -- -- -- -- -- -- ---------------- --------------------
    c8 00 08 58 7e 5e e7 00 00:00:00.295 READ DMA
    ca 00 80 e8 d3 d3 e5 00 00:00:00.295 WRITE DMA
    ef 10 02 00 00 00 a0 00 00:00:00.295 SET FEATURES [Enable SATA feature]
    27 00 00 00 00 00 e0 00 00:00:00.295 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3]
    ec 00 00 00 00 00 a0 00 00:00:00.295 IDENTIFY DEVICE

    Error 121 occurred at disk power-on lifetime: 18740 hours (780 days + 20 hours)
    When the command that caused the error occurred, the device was active or idle.

    After command completion occurred, registers were:
    ER ST SC SN CL CH DH
    -- -- -- -- -- -- --
    40 51 08 58 7e 5e e7 Error: UNC 8 sectors at LBA = 0x075e7e58 = 123633240

    Commands leading to the command that caused the error were:
    CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
    -- -- -- -- -- -- -- -- ---------------- --------------------
    c8 00 08 58 7e 5e e7 00 00:00:00.289 READ DMA
    c8 00 10 a0 c8 15 e6 00 00:00:00.288 READ DMA
    c8 00 08 68 c8 10 e6 00 00:00:00.288 READ DMA
    c8 00 08 a0 c6 10 e6 00 00:00:00.288 READ DMA
    c8 00 08 50 77 55 e9 00 00:00:00.288 READ DMA

    Error 120 occurred at disk power-on lifetime: 18740 hours (780 days + 20 hours)
    When the command that caused the error occurred, the device was active or idle.

    After command completion occurred, registers were:
    ER ST SC SN CL CH DH
    -- -- -- -- -- -- --
    40 51 08 58 7e 5e e7 Error: UNC 8 sectors at LBA = 0x075e7e58 = 123633240

    Commands leading to the command that caused the error were:
    CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
    -- -- -- -- -- -- -- -- ---------------- --------------------
    c8 00 08 58 7e 5e e7 00 00:00:00.249 READ DMA
    c8 00 40 c0 17 94 e5 00 00:00:00.249 READ DMA
    c8 00 f0 30 aa 40 e0 00 00:00:00.249 READ DMA
    c8 00 58 c8 ad 85 e0 00 00:00:00.249 READ DMA
    ef 10 02 00 00 00 a0 00 00:00:00.249 SET FEATURES [Enable SATA feature]

    Error 119 occurred at disk power-on lifetime: 18740 hours (780 days + 20 hours)
    When the command that caused the error occurred, the device was active or idle.

    After command completion occurred, registers were:
    ER ST SC SN CL CH DH
    -- -- -- -- -- -- --
    40 51 08 58 7e 5e e7 Error: UNC 8 sectors at LBA = 0x075e7e58 = 123633240

    Commands leading to the command that caused the error were:
    CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
    -- -- -- -- -- -- -- -- ---------------- --------------------
    c8 00 08 58 7e 5e e7 00 00:00:00.243 READ DMA
    c8 00 20 20 ac 85 e0 00 00:00:00.243 READ DMA
    c8 00 70 18 54 57 e4 00 00:00:00.243 READ DMA
    c8 00 18 a8 22 dd e5 00 00:00:00.243 READ DMA
    c8 00 d8 48 ab 85 e0 00 00:00:00.243 READ DMA

    SMART Self-test log structure revision number 1
    Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
    # 1 Short offline Completed without error 00% 3702 -
    # 2 Short offline Aborted by host 70% 3701 -
    # 3 Short offline Completed without error 00% 0 -
    # 4 Short offline Completed without error 00% 0 -

    SMART Selective self-test log data structure revision number 0
    Note: revision number not 1 implies that no selective self-test has ever been run
    SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
    1 0 0 Completed [00% left] (0-65535)
    2 0 0 Not_testing
    3 0 0 Not_testing
    4 0 0 Not_testing
    5 0 0 Not_testing
    Selective self-test flags (0x0):
    After scanning selected spans, do NOT read-scan remainder of disk.
    If Selective self-test is pending on power-up, resume after 0 minute delay.

    0 4
  • #2 06 Gru 2016 20:03
    kokapetyl
    Poziom 43  

    Koms77 napisał:
    Dysk nie został mechanicznie uszkodzony

    Jednak jest :D . Zaliczył wiele wstrząsów, nie koniecznie upadków.
    SMART nie przedstawia większych problemów z dyskiem, dysk już swoje napracował i nie będzie idealny. Jaki był powód wykonywania zerowania i remap, szkoda że nie pokazałeś wyników przed zerowaniem.

    0
  • #3 06 Gru 2016 20:19
    Koms77
    Poziom 9  

    Na początku wyskakiwały mi błędy odczytu/zapisu podczas startu systemu, później padł całkowicie (nie startował przez błędy). Przeskanowałem go wtedy HD tune, po około 30% skanu było już około 6-8 (nie pamiętam dokładnie) "czerwonych punktów" w losowych miejscach (nie obok siebie). Z tym uszkodzeniem chodziło mi o to że nie upadł w tej 18740 godzinie użytkowania z której są ostatnie błędy. Dysk znajduje się w laptopie, więc to tłumaczy te wstrząsy. Zdaję sobie sprawę że po nabiciu prawie 19k h nie bedzie działał jak nowy, zastanawiam się tylko czy spodziewać się zakończenia przez niego żywotu w ciągu najbliższych dni czy miesięcy.

    0
  • Pomocny post
    #4 06 Gru 2016 20:32
    kokapetyl
    Poziom 43  

    Koms77 napisał:
    zastanawiam się tylko czy spodziewać się zakończenia przez niego żywotu w ciągu najbliższych dni czy miesięcy.

    Tego nie wie nikt, nawet przy nowym dysku.
    Jak dla mnie, nic nie wskazuje, aby dysk miał skończyć żywot.

    0
  • #5 06 Gru 2016 20:38
    Koms77
    Poziom 9  

    Dzięki za pomoc o to mi chdziło :-o

    0